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NFL Projects |
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Liliya Nikolova |
| PHD Student Université du Québec Telephone: +1 (450) 929-8178 |
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| Dynamics at Nanoscale by Ultrafast Electron Microscopy | |
* * * * * The transmission electron microscope (TEM) is a powerful and versatile tool for materials characterisation offering very high spatial resolution. However, it is not suitable for direct imaging of structural transitions because of the poor temporal resolution. In fact, the images capture could require few seconds. The goal of this research project is the modification of a TEM to Dynamic TEM (DTEM) to improve the temporal resolution and to reveal the dynamics of irreversible processes of structural transformation (as nucleation, interphase boundary motion, shock propagation, radiation damage, solid state chemical reactions, etc). Therefore, one of the key modifications of the TEM is the replacement of the conventional thermionic or field emission gun with a source of type photocathode. By this manner generation of packets of electrons with high density through pulsed laser excitement is obtained. Hence, high temporal resolution (nanosecond or better) is achievable while maintaining the high spatial resolution (few nanometers). The structural transition in the sample is initiated by a ‘pump’ laser pulse. The specimen images are taken at a variable time-delay after the excitation using the short burst of electrons that takes a ‘snapshot’ of the sample. The method permits to make a movie of the evolution of the sample's structure.
Fellowships 2009 Alexander Graham Bell Canada Graduate Scholarship D - Natural Science and Engineering Research Council of Canada (NSERC) 2009 Postgraduate Scholarship D - NSERC2008 Doctoral research scholarship - Fonds Québécois de Recherche sur la Nature et les Technologies
Publications L. Nikolova, R.G. Saint-Jacques, G.G. Ross (2010) Characterization of Si nanocrystals by different TEM based techniques, Ultramicroscopy, vol. 110, p. 144 L. Nikolova, R.G. Saint-Jacques, C. Dahmoune, G.G. Ross (2009) Si nanoparticule formation in SiO2 by Si ion implantation: effect of energy and fluence on size distribution and on SiO2 composition, Surface and Coatings Technology, vol. 203, p. 2501 V. Levitcharsky, R.G. Saint-Jacques, Y.Q. Wang, L. Nikolova, R. Smirani and G.G. Ross (2007) Si implantation in SiO2: Stucture of Si nanocrystals and composition of SiO2 layer, Surface and Coatings Technology, vol. 201, Issues 19-20, p. 8547
Curriculum Vitae Master degree in Materials Science – INRS-ÉMT, CanadaMaster degree in Engineer Physics – Sofia University « St. Kliment of Ohrid”, Bulgaria A.E.C. Fabrication and Characterization of nanomaterials – André Laurendeau, Canada |
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