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Zhaochun Lin

MSC Student

Université du Québec
Institut national de la recherche scientifique
Énergie, Matériaux et Télécommunications
1650, boulevard Lionel-Boulet
Varennes, Québec, Canada
J3X 1S2

 
Characterization of the growth of thin Ge layers on graphite (HOPG) by pulsed laser deposition

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Heteroepitaxy of materials with a high lattice mismatch offers the possibility to grow compound structures with novel properties. The grown layers may either wet the surface or self-assemble into electron-confining structures, such as quantum dots (QDs) or quantum wires (QWs), which may be used as building blocks for new optoelectronic technologies.
The growth of thin Ge layers on highly oriented pyrolitic graphite (HOPG) represents a model system in crystal growth. Since Ge is lattice matched to GaAs, developing the ability to grow thin flat Ge films would yield substrates to be used for the growth of III–V layers. On the other hand, because of the high lattice mismatch and low chemical affinity, Ge is very likely to grow in the form of nanosized clusters with interesting optical properties. The goal of the project consists in comparing the growth of Ge on HOPG by molecular beam epitaxy (MBE) and PLD.

Operating the PLD chamber.

Atomic Force Microscopy (AFM) phase image of a nonostructured film of Ge deposited on HOPG by PLD. Image dimensions: 2.65 µm X 2.65 µm.